Photograph

Name
WATANABE Akihiko
Affiliation
Faculty of Engineering
Department of Electrical Engineering and Electronics
Title
Assistant Professor
Research areas, keyword
Power Semiconductor Devices, Power Electronics, Surface Science
School Attended (except graduate school)
  • Kyushu Institute of Technology , Faculty of Engineering

    University , 1994.03 , Graduated , JAPAN

Graduate School Attended, etc.
  • Kyushu Institute of Technology , Graduate School, Division of Engineering

    Doctor Course , 1999.03 , Accomplished Credits for Doctoral Program , JAPAN

Degree
  • Doctor of Engineering , Other , Kyushu Institute of Technology , Coursework , 1999.06

Employment Record in Research
  • Department of Electrical Engineering and Electronics, Faculty of Engineering, Kyushu Institute of Technology, Assistant Professor, 2008.04 -

External Career
  • , Researcher , 1999.04 - 2003.03

  • , Researcher , 1999.04 - 2003.03

Published papers (2006.4〜)
  • English , Failure analysis of power devices based on real-time monitoring , Microelectronics Reliability , vol.55 (9-10) (p.2032 - 2035) , 2015.08 , A. Watanabe, M. Tsukuda, I. OmuraA. Watanabe, M. Tsukuda, I. Omura

    DOI:10.1016/j.microrel.2015.06.128, International Conference Proceedings , The Multiple Authorship

  • English , Real-time failure monitoring system for high power IGBT under acceleration test up to 500 A stress , Proceedings of The 26th International Symposium on power semiconductor devices and ICS (ISPSD2014) (p.338 - 341) , 2014.06 , A. Watanabe, M. Tsukuda, I. Omura

    DOI:10.1109/ISPSD.2014.6856045, International Conference Proceedings , The Multiple Authorship

  • English , Internal degradation monitoring of power devices during power cycling test , Proceedings of 8th International Conference on Integrated Power Electronics Systems (CIPS2014) (p.1 - 6) , 2014.02 , A. Watanabe, M. Tsukuda, I. Omura

    International Conference Proceedings , The Multiple Authorship

  • English , Real time degradation monitoring system for high power IGBT module under power cycling test , Microelectronics Reliability , vol.53 (9-11) (p.1692 - 1696) , 2013.09 , A. Watanabe, M. Tsukuda, I. Omura

    DOI:10.1016/j.microrel.2013.07.084, Academic Journal , The Multiple Authorship

  • English , Real-time failure imaging system under power stress for power semiconductors using Scanning Acoustic Tomography (SAT) , Microelectronics Reliability , vol.52 (9-10) (p.2081 - 2086) , 2012.09 , Watanabe A., Omura I.Watanabe A., Omura I.

    DOI:10.1016/j.microrel.2012.06.090, Academic Journal , The Multiple Authorship

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Research presentations (2006.4〜)
  • International Symposium on Applied Engineereing and Sciences (SAES2016), Conference with screening , 2016.12 , Combined real-time monitoring system for failure prediction of power devices , The Oral (generality)

  • International Symposium on Applied Engineereing and Sciences (SAES2016), Conference with screening , 2016.12 , An observation system for temperature distribution on power semiconductor , The Poster (generality)

  • International Symposium on Applied Engineereing and Sciences (SAES2016), Conference with screening , 2016.12 , Real-time 2D imaging system of temperature distribution inside a power device , The Oral (generality)

  • 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2015), Conference with screening , 2015.10 , Failure analysis of power devices based on real-time monitoring , The Poster (generality)

  • International Symposium on Applied Engineereing and Sciences (SAES2014), Conference with screening , 2014.12 , Numerical design method of multi-turn coil for wireless power transfer circuit based on electrical circuit simulation , The Poster (generality)

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Updated on 2017/07/27